Random access memory Neutron Hardware Modeling Power demand Atmospheric neutrons Fault Injection Fault attacks Machine Learning Integrated circuit reliability Fault Tolerance Digital ATE Performance Radiation Monitoring Cryptography 1-bit acquisition Approximate computing Microprocessors VLSI Machine learning Process variability Energy efficiency Neutrons Accelerometer Test efficiency Education Variability STT-MRAM Logic gates Fiabilité Circuit faults Estimation IoT Integrated circuit modeling AES Digital signal processing Automatic test pattern generation Robustness Reliability Integrated circuit interconnections Soft error CMOS Cross section Design space exploration ATPG RF integrated circuits ZigBee Testing MRAM Integrated circuits Countermeasures Silicon Noise measurement Software Indirect testing Computer architecture Failure analysis SoC Fault tolerance Power supplies RSA Embedded systems Power consumption Design Integrated circuit testing Single event upset SEU Test cost reduction Magnetic tunneling Delays Simulation Integrated circuit design Hardware security Protons RF test Switches Test Clocks SRAM Transistors Test and Security SEU Carbon nanotubes DPA Phase noise FPGA Sécurité Security MEMS Approximate Computing Noise 3D integration Through-silicon vias Fault injection Internet of Things Soft errors BIST Crosstalk Sensors Spintronics