Circuit faults Integrated circuit modeling Fault attacks Sensors Approximate computing Integrated circuits Test efficiency Power demand DPA Integrated circuit interconnections Reliability SEU Carbon nanotubes Power supplies Fault Injection Atmospheric neutrons Soft errors Design Neutrons Software VLSI Hardware security Fault injection 3D integration ATPG Noise measurement Fault tolerance Failure analysis Education MRAM Switches Radiation Approximate Computing FPGA Transistors MEMS Silicon Energy efficiency Embedded systems Sécurité Integrated circuit reliability Delays Testing RF test Digital ATE Machine Learning Security Test and Security SoC Single event upset SEU SRAM Spintronics Power consumption Test Countermeasures Variability AES Simulation Computer architecture Automatic test pattern generation ZigBee BIST Robustness 1-bit acquisition Through-silicon vias Clocks Cross section Hardware Test cost reduction RSA Noise Integrated circuit design Monitoring Protons Process variability Estimation Fault Tolerance Phase noise IoT STT-MRAM Digital signal processing Random access memory Indirect testing RF integrated circuits CMOS Design space exploration Fiabilité Performance Soft error Accelerometer Neutron Logic gates Internet of Things Crosstalk Machine learning Magnetic tunneling Microprocessors Cryptography Modeling Integrated circuit testing