Delays Heavy ions BIST Switches Memories Security Flip-flops Cryptographie Electromagnetic Analysis Reliability Memory device Calibration Cross section Diagnostic Education Countermeasures Cross-section Logic testing Embedded systems Circuit faults Fault modeling Failure analysis Protons Hardware Trojan Modeling MRAM DPA Integrated circuit modeling Crosstalk Delay testing Analytical models Automatic test pattern generation Microprocessors VLSI Single event upset SEU Hardware Ring oscillators Radiation Fiabilité Logic gates Through-silicon vias Magnetic tunneling Power demand Soft Error Rate Variability Registers Testing SER Sensors Test RSA Integrated circuit testing Fault tolerance Soft Errors Atmospheric neutrons Heating Cryptography Fault injection Neutron Computer architecture Transient faults FPGA Accelerometers Memory test Simulation SRAM Thermal sensor Soft errors Random access memory ATPG Libraries Low-power design Robustness Design space exploration Testability DFT Fault attacks Clocks Transistors SEU Field programmable gate arrays AES Multiple cell upset MCU Software Single Event Upset Design MEMS Accelerometer Integrated circuit interconnections Monitoring Silicon Integrated circuit design CMOS integrated circuits Core-cell SoC Neutrons Power consumption Side-Channel Attacks Low power CMOS